The double perovskite materials show the magnetic semiconductor, magneto-optic and magneto-capacitance like interesting properties. It is predicted that the B-site substitution in this system may results in interesting properties. La2Ni1-xFexMnO6 thin films are deposited on Pt/Ti/ Si(100) substrate  by Pulse Laser Deposition (PLD) technique. The films were uniform, fine grain and stoichiometric deposited at very low O2 pressure. The XRD of La2Ni1-xFexMnO6 thin films exhibits rhombohedral (R-3) phase. The peak broadening appears in Raman spectra at antistretching (518 cm -1 ) and stretching (656 cm -1 ) modes with presence of overtone modes at 1308 cm -1 in La2Ni1-xFexMnO6 thin film samples. XPS analysis reveals the presence of La 3+ , NiO, Ni 3+ , Fe 3+ , Mn 3+ and oxygen vacancies in samples. The Ni 3+ and Mn 3+ antiferromagnetic coupling is responsible for decrease in saturation magnetization Ms from 4.78 to 2.74 µB/f.u as Fe substitution increases from 0.1 to 0.3 at 5K. The increase in grain size, peak broadening and decrease in magnetization of La2Ni1-xFexMnO6thin film samples suggest presence of antisite defects and antisite phase boundary. The present work will helpful to study the effect of B site substitution on La2NiMnO6 thin films structural, electronic and magnetic properties in order to make it suitable candidate for potential applications.