A. K. Sahu; Priyambada Mallick; S. K. Satpathy; Banarji Behera
Abstract
Synthesis of polycrystalline samples of Bi1-xNdxFeO3 [x = 0.5, 0.6, 0.7 and 0.8] were demonstrated following solid-state reaction method at high temperature. The structural properties of the sample were confirmed through the X-ray diffraction technique. The dielectric study of the compounds was performed ...
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Synthesis of polycrystalline samples of Bi1-xNdxFeO3 [x = 0.5, 0.6, 0.7 and 0.8] were demonstrated following solid-state reaction method at high temperature. The structural properties of the sample were confirmed through the X-ray diffraction technique. The dielectric study of the compounds was performed at different frequencies in the range of 100 Hz – 10 6 Hz for various temperatures. The non-Debye type of relaxation process confirmed from impedance analysis. The materials showed a negative temperature coefficient of resistance (NTCR) behavior at various temperatures and frequencies. AC conductivity of the materials with frequency at different temperatures satisfied the universal power law of Johnscher. Thermistor constant (β), sensitivity factor (α), and stability factor for all the samples were calculated and confirmed the characteristics of NTC thermistor.
Srikanta Moharana; Anjali Kujur; Sudhir Minz; R. N. Mahaling; Banarji Behera
Abstract
Nickel ferrite [NiFe2O4 (NFO)] nanoparticles were synthesized using a simple precursor based chemical route and modified with tetraethoxysilane (TEOS) to form SiO2 layer adsorbed on the NFO particles (SiO2@NFO). Based on the nanoparticles, the SiO2@NFO-PMMA composite films were prepared embedded with ...
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Nickel ferrite [NiFe2O4 (NFO)] nanoparticles were synthesized using a simple precursor based chemical route and modified with tetraethoxysilane (TEOS) to form SiO2 layer adsorbed on the NFO particles (SiO2@NFO). Based on the nanoparticles, the SiO2@NFO-PMMA composite films were prepared embedded with SiO2@NFO nanoparticles in a poly (methylmethacrylate) (PMMA) matrix. The properties of the composites were characterized extensively using X-ray diffraction (XRD), scanning electron microscopy (SEM), Fourier transform infrared (FTIR) spectroscopy, dielectric and electrical measurement. FTIR analysis showed that the SiO2 groups had been successfully introduced into the NFO nanoparticles. The SEM images of the SiO2 adsorbed NFO nanoparticles had better dispersion in the PMMA matrix than the unmodified one. The SiO2 modified NFO-PMMA composites had much higher dielectric constant and better suppressed dielectric loss than the other two phase composite systems. The maximum dielectric constant was up to ≈ 67 while the dielectric loss was controlled below 0.5. This study suggested that the SiO2 modified NFO-PMMA composite films with high dielectric constant and low loss might be promising candidates for application in microelectronic engineering.
