Volume 13 (2022)
Volume 12 (2021)
Volume 11 (2020)
Volume 10 (2019)
Volume 9 (2018)
Volume 8 (2017)
Volume 7 (2016)
Volume 6 (2015)
Volume 5 (2014)
Volume 4 (2013)
Volume 3 ( 2012)
Volume 2 (2011)
Volume 1 (2010)
Spectroscopic identification of ultranano-crystalline phases within amorphous/nano-crystalline silicon

Mansi Sharma; Deepika Chaudhary; S. Sudhakar; Preetam Singh; K. M. K. Srivatsa; Sushil Kumar

Volume 8, Issue 2 , February 2017, , Pages 163-169

http://dx.doi.org/10.5185/amlett.2017.6451

Abstract
  The structural transition in accordance to nano sized grain distribution within the amorphous silicon matrix has been described on the basis of spectroscopic analysis as a result of variable input power applied during growth via plasma enhanced chemical vapor deposition (PECVD) process. For this, characterization ...  Read More

Growth And Field Emission Properties Of Vertically-aligned ZnO Nanowire Array On Biaxially Textured Ni-W Substrate By Thermal Evaporation

Deepak Chhikara; K. M. K. Srivatsa; M. Senthil Kumar; Preetam Singh; Sourav Das; O. S. Panwar

Volume 6, Issue 10 , October 2015, , Pages 862-866

http://dx.doi.org/10.5185/amlett.2015.5886

Abstract
  Vertically well aligned and highly dense ZnO nanowires (NWs) have been grown on biaxially textured Ni substrates by a simple thermal evaporation technique over a large area without using any catalyst. The grown ZnO NWs have crystallized in wurtzite hexagonal structure and have grown along [0001] direction. ...  Read More

Single Oriented CeO2 Buffer Layer Deposition On Biaxially Textured Ni-W Substrate By RF Magnetron Sputtering

K.M.K. Srivatsa; Preetam Singh; Sourav Das

Volume 6, Issue 10 , October 2015, , Pages 883-887

http://dx.doi.org/10.5185/amlett.2015.5884

Abstract
  Considerable attention has been gained on the deposition of CeO2 thin films with (200) single orientation as hetero-epitaxial buffer layer on (200) oriented biaxially textured flexible Ni substrates, in the fabrication of superconductor and semiconducting epitaxial thin films for device applications. ...  Read More

Effect Of Substrate Temperature On Nanocrystalline CeO2 Thin Films Deposited On Si Substrate By RF Magnetron Sputtering

Preetam Singh; K. M. K. Srivatsa;Sourav Das

Volume 6, Issue 5 , May 2015, , Pages 371-376

http://dx.doi.org/10.5185/amlett.2015.5777

Abstract
  Single oriented nanocrystalline CeO2 thin films have been deposited over Si (100) substrate by RF magnetron sputtering in the temperature range 600-700 o C, using CeO2 target. X-ray diffraction pattern for the as deposited CeO2 film at 700 o C shows the dominant (111) orientation with corresponding FWHM ...  Read More

Growth And Characterization Of Large Grained Poly-Si Films Grown On Biaxially Textured Ni-W Substrate By Hot-wire CVD

Preetam Singh; K. M. K. Srivatsa; Sourav Das

Volume 6, Issue 5 , May 2015, , Pages 436-441

http://dx.doi.org/10.5185/amlett.2015.5754

Abstract
  Polycrystalline Si (Poly-Si) film with highly crystalline nature, and having most of the grains in the range of 50-100 µm has been grown over biaxially textured Ni-W substrate by Hot-wire chemical vapor deposition technique, using a single buffer layer of CeO2 thin film. This result has been achieved ...  Read More