Shigehiro Hashimoto
Abstract
An erythrocyte has high deformability. In the shear field, it deforms from biconcave disc to ellipsoid, and make tank-treading motion at the membrane. When the membrane is ruptured by fatigue, contents get out from the inside of the cell (hemolysis). At the fatigue test of the membrane in the shear field, ...
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An erythrocyte has high deformability. In the shear field, it deforms from biconcave disc to ellipsoid, and make tank-treading motion at the membrane. When the membrane is ruptured by fatigue, contents get out from the inside of the cell (hemolysis). At the fatigue test of the membrane in the shear field, “the shear stress” as “the amplitude” and “the shear rate” × “the exposure time” as “repeat count” are critical parameters. For the quantitative fatigue test, the uniform shear field has been realized between the rotating concave cone and the stationary convex cone. With the rheoscope, deformability is evaluated with shear stress responsiveness and with critical deformation calculated from an exponential curve between the deformation ratio (the ratio between the major axis and the minor axis of the ellipsoidal shape) and the shear stress. Deformability decreases at erythrocytes of high density after shearing. The erythrocytes deformation ratio varies periodically at the double frequency of tank-treading motion of the membrane, when the erythrocyte has the sublethal damage point on the membrane.
D. Ambika; V. Kumar; K. Tomioka; Isaku Kanno
Abstract
Pb(ZrxTi1-x)O3 [PZT] thin films of morphotropic phase boundary (MPB) composition having {001}, {110}, and {111}-orientations were fabricated on silicon substrates (111)Pt/Ti/SiO2/Si using a metal organic decomposition spin-coating technique. The influence of crystallographic orientation on the transverse ...
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Pb(ZrxTi1-x)O3 [PZT] thin films of morphotropic phase boundary (MPB) composition having {001}, {110}, and {111}-orientations were fabricated on silicon substrates (111)Pt/Ti/SiO2/Si using a metal organic decomposition spin-coating technique. The influence of crystallographic orientation on the transverse piezoelectric coefficient e31 * of the films have been determined. The largest e31* was found in {110}-oriented film. The differences observed in e31 * have been explained on the basis of domain wall contributions which are dependent on film texture. The influence of thin film texture on polarization switching characteristics have also been studied.
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