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Defect Analysis And Performance Evaluation Of P-type Epitaxial GaAs Layer On Ge Substrate For GaAs/Ge Based Advanced Device

Goutam Kumar Dalapati; Vignesh Suresh; Sandipan Chakraborty; Chandreswar Mahata; Yi Ren; Thirumaleshawara Bhat; Sudhiranjan Tripathy; Taeyoon Lee; Lakshmi Kanta Bera; Dongzhi Chi

Volume 7, Issue 7 , July 2016, , Pages 517-524

https://doi.org/10.5185/amlett.2016.6439

Abstract
  The structural defects and formation of native oxides during thermal treatment on p-type epitaxial-GaAs/Ge have been investigated using spectroscopic measurements and electrical characterization. The performance of epi-GaAs based device depends on the interface quality between epi-GaAs and gate oxide ...  Read More