TY - JOUR ID - 14764 TI - Thickness Effect On Nano-multilayered Sb/As2S3 Chalcogenide Thin Films JO - Advanced Materials Letters JA - AML LA - en SN - 0976-3961 AU - Naik, Ramakanta AD - Y1 - 2016 PY - 2016 VL - 7 IS - 10 SP - 821 EP - 825 KW - chalcogenides KW - thin film KW - EDAX KW - FTIR KW - optical properties DO - 10.5185/amlett.2016.6339 N2 - The nano multilayered thin films of Sb/As2S3 metal chalcogenide were prepared by thermal evaporation technique under high vacuum. The optical parameters such as optical band gap, tauc parameter, urbach energy were determined from the transmission spectra using Fourier Transform Infrared Spectroscopy. These properties are greatly influenced by the thickness of the nano layered Sb/As2S3 thin film. The Small Angle X-ray diffraction study reveals the amorphous nature of these films. The analysis reveals that the optical band gap decreases with increase in thickness due to Sb metal. The tauc parameter and urbach energy supports the optical property change. Such type of dependence is attributed to quantum size effect in semiconductors. UR - https://aml.iaamonline.org/article_14764.html L1 - https://aml.iaamonline.org/article_14764_2c482a55c15fc773b051888193231502.pdf ER -