TY - JOUR ID - 14317 TI - High Stability Field Emission From Zinc Oxide Coated Multiwalled Carbon Nanotube Films JO - Advanced Materials Letters JA - AML LA - en SN - 0976-3961 AU - Patra, Rajkumar AU - Ghosh, Santanu AU - Sharma, Himani AU - D. Vankar, Vasant AD - Y1 - 2013 PY - 2013 VL - 4 IS - 11 SP - 849 EP - 855 KW - carbon nanotube KW - field emission KW - Raman spectroscopy KW - Zinc oxide KW - TEM DO - 10.5185/amlett.2013.4465 N2 - A comparative study of electron field emission (FE) property of pristine mutiwalled carbon nanotubes (p-CNTs), zinc (Zn) coated CNTs (Zn-CNT), zinc oxide (ZnO) coated CNTs (ZnO-CNT) is reported. CNTs were synthesized on p-type Si (100) by microwave plasma enhanced chemical vapor deposition (MPECVD) method and the sample was divided into three parts. On two of these parts, a thin layer (~ 4nm) of Zn film was deposited. One of these (Zn-CNT) was kept for analysis and the other one was annealed in oxygen (O2) atmosphere at 520° C for 60 minutes to get ZnO coated CNT film (ZnO-CNT). Scanning electron microscope (SEM) analysis confirmed CNT formation as well as Zn and ZnO coating on the top of p-CNT films. Further, energy-dispersive X-ray spectroscopy (EDX) results confirmed the presence of zinc and oxygen in these two samples. A detailed field emission study performed in these films give following results: (i) lowest turn-on field (electric field required to produce 10 μA/cm 2 current density) and threshold fields (electric field required to produce 100 μA/cm 2 current density) for pristine sample (3.3 V/μm and 5.1 V/μm respectively), followed by ZnO-CNT sample (3.7 V/μm and 6.3 V/μm respectively); (ii) highest temporal stability in current density versus field (J-E characteristics) in ZnO-CNT film as compared to other two, (iii) highest field enhancement factor in ZnO-CNT films as compared to other two. The FE results are correlated with microstructures of the samples as revealed by micro-Raman spectroscopy and transmission electron microscopy (TEM) studies. UR - https://aml.iaamonline.org/article_14317.html L1 - https://aml.iaamonline.org/article_14317_d5d611b5f83a0c402e3dc81348e0af25.pdf ER -