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The Influence Of Substrate Temperature On The Structure, Morphology, And Optical Properties Of ZrO2 thin Films Prepared By E-beam Evaporation

K. J. Patel; M. S. Desai; C. J. Panchal

Volume 3, Issue 5 , November 2012, , Pages 410-414

https://doi.org/10.5185/amlett.2012.5364

Abstract
  Zirconium dioxide thin films were prepared by e-beam evaporation method to study the effect of substrate temperature on the structural, surface morphology, compositional, and optical properties. X-ray diffraction measurement shows that the films grown at 400 ℃ substrate temperature ...  Read More