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Fabrication and characterization of nano-bridge Josephson junction based on Fe0.94Te0.45Se0.55 thin film

Jia Lu; Wen Zhang; Zheng Wang; Xiaoming Ma; Shicai Shi; Lei Yan; Hong Ding

Volume 10, Issue 5 , May 2019, , Pages 319-323

https://doi.org/10.5185/amlett.2019.2270

Abstract
  Nano-bridge Josephson junction has been fabricated with Fe0.94Te0.45Se0.55 (FTS) thin films by using focused ion beam etching (FIB). Electrical properties of the Josephson effects of the nano-bridge have been deeply studied. Current-voltage (I-V) characteristics of the junction exhibit resistively and ...  Read More

Fabrication and characterization of nano-bridge Josephson junction based on Fe<sub>0.94</sub>Te<sub>0.45</sub>Se<sub>0.55</sub> thin film