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Spectroscopic identification of ultranano-crystalline phases within amorphous/nano-crystalline silicon

Mansi Sharma; Deepika Chaudhary; S. Sudhakar; Preetam Singh; K. M. K. Srivatsa; Sushil Kumar

Volume 8, Issue 2 , February 2017, , Pages 163-169

https://doi.org/10.5185/amlett.2017.6451

Abstract
  The structural transition in accordance to nano sized grain distribution within the amorphous silicon matrix has been described on the basis of spectroscopic analysis as a result of variable input power applied during growth via plasma enhanced chemical vapor deposition (PECVD) process. For this, characterization ...  Read More