Volume 15 (2024)
Volume 14 (2023)
Volume 13 (2022)
Volume 12 (2021)
Volume 11 (2020)
Volume 10 (2019)
Volume 9 (2018)
Volume 8 (2017)
Volume 7 (2016)
Volume 6 (2015)
Volume 5 (2014)
Volume 4 (2013)
Volume 3 ( 2012)
Volume 2 (2011)
Volume 1 (2010)
Interfacial Mixing In Te/Bi Thin Film System

T. Diana; D. C. Agarwal; P. K. Kulriya; S. K. Tripathi; H. Nandakumar Sarma

Volume 5, Issue 4 , April 2014, , Pages 223-228

https://doi.org/10.5185/amlett.2013.7510

Abstract
  100 MeV Ag ions have been used to study the swift heavy ion (SHI) induced modification in Te/Bi bilayer system. The samples were analysed using Rutherford backscattering spectroscopy (RBS), Atomic force microscopy (AFM) and X-ray diffractometer (XRD). The elemental depth study with RBS results show a ...  Read More

Study on synthesis of magnetic nanocomposite (Ni-Teflon) by swift heavy ion beam mixing

Jai Prakash; A. Tripathi; J.C. Pivin; Jalaj Tripathi; A.K. Chawla; Ramesh Chandra; S.S. Kim; K. Asokan; D.K. Avasthi

Volume 2, Issue 1 , March 2011, , Pages 71-75

https://doi.org/10.5185/amlett.2010.12187

Abstract
  The present work envisages synthesis of magnetic nanocomposites by ion beam mixing technique using swift heavy ion irradiation of Ni-Teflon bilayer system and its magnetic characterizations. The nanocomposite is characterized by Rutherford backscattering spectrometry (RBS), transmission electron microscopy ...  Read More